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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 11-18 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is shown that when a narrow x-ray beam is used in energy dispersive fluorescence analysis of thick, low-Z samples large deviations from the predictions of the commonly used fundamental parameter model occur. A simple method by which the effects can be studied empirically is described. An approximate model allowing a direct calculation of the effécts is introduced. The validity of the model has been confirmed experimentally.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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