ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
It is shown that when a narrow x-ray beam is used in energy dispersive fluorescence analysis of thick, low-Z samples large deviations from the predictions of the commonly used fundamental parameter model occur. A simple method by which the effects can be studied empirically is described. An approximate model allowing a direct calculation of the effécts is introduced. The validity of the model has been confirmed experimentally.
Additional Material:
12 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300120105