Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
14 (1985), S. 62-68
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The PIXE (particle-induced x-ray emission) depth profiling technique was applied to brass coatings on steel wire. Applying protons with energies E0 = 100-360 keV from a small electrostatic accelerator, the surface region to a depth of up to about 1 μm can be investigated. Three, or at maximum four, parameters of a suitable model function for the concentration profile were evaluated by analysing the ratio of Cu Kα and Zn Kα experimental x-ray yields as a function of the primary energy of the particles.
Additional Material:
10 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300140206
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