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Cathodoluminescence wavelength imaging for spatial mapping of excitons bound to dislocations and structural defects in cds (1992)

Hoffmann, A. ; Christen, J. ; Gutowski, J.

New York, NY [u.a.] : Wiley-Blackwell

Advanced Materials for Optics and Electronics 1 (1992), S. 25-28

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ISSN: 1057-9257

Keywords: Cathodoluminescence ; Cadmium sulphide ; Dislocation structure ; Wavelength imaging ; Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Notes: By means of the unique technique of cathodoluminescence wavelength imaging we analyse the distribution and nature of dislocations in strain-distorted CdS by scanning the spatial pattern of a set of lines due to excitons bound to dislocation-related defects. The method is demonstrated to be most powerful for the study of dislocations in II-VI and other materials which play a crucial role in hetero-epistructures.

Additional Material: 2 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/amo.860010105

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