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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 11 (1998), S. 207-219 
    ISSN: 0894-3370
    Keywords: Engineering ; Numerical Methods and Modeling
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The IMPETUS II code simulates the atomic mixing and particle emission that occurs when a solid is bombarded by energetic particles (as in SIMS or SNMS). The underlying model consists of a system of partial differential equations that are solved by a finite difference method (FDM). Special techniques are also employed to model thin layers and sharp interfaces, to deal efficiently with wide homogeneous layers (when the solution is tending to a steady state), to model linear diffusion in order to smooth the sharp interfaces before they enter to domain of the FDM.In this paper the special techniques are described in detail. Results from test problems, demonstrating these techniques, are shown. An algorithm that describes the way the IMPETUS II code is structured is given. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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