ISSN:
1572-9559
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract We have performed systematic measurements on a W-Ni MIM point contact diode at different IR, FIR, and IF frequencies in order to investigate the mechanisms responsible for the different response times observed in the diode operation. Our results led to the experimental confirmation of a second effect of thermal nature, besides tunnel effect, responsible for the diode operation. We measure the cutoff frequency of this second effect, which results in good agreement with our theoretical interpretation.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01009053