ISSN:
1572-817X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Contactless measuring techniques are becoming increasingly important for industrial applications. The use of a laser, solid-state detector arrays and powerful small computers leads to a very efficient fringe analysis in holography as well as in Moiré and speckle techniques. Due to the computer analysis, much more information can be extracted from interferograms, leading to higher sensitivities and accuracies. The application of different fringe analysis procedures is discussed, together with some potentials of the application of interferometry, holography, and speckle and Moiré techniques.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02027299
