ISSN:
1434-601X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Projectile and target X-ray cross-sections have been measured in collisions of bare and hydrogenlike Silicon ions with argon atoms. Projectile energies are 125 MeV and 153 MeV, i.e. the intermediate velocity region forK-shell capture. Coincidence measurements between X-ray photons and the scattered Si n+ projectiles with charge statesn-1,n-2 andn-3 have been made. The relative contribution of charge exchange and direct ionization (or excitation) of the targetK-shell has been obtained directly by this new method. DoubleK-shell electron transfer is demonstrated to be very large in the case of fully stripped Si ions. A thorough theoretical analysis of the data is carried out and multiple capture processes are evaluated using an independent electron model.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01438357