Electronic Resource
Springer
Fresenius' journal of analytical chemistry
364 (1999), S. 224-227
ISSN:
1432-1130
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract X-ray fluorescence spectrometry (XRF) was applied to determine aluminium in AlCl3- and Al2O3-modified silica catalyst supports that were prepared by gas-solid reactions in an atomic layer epitaxy (ALE) process using aluminium chloride or aluminium chloride and water as adsorbates and silica as support. INAA and AAS were used as reference methods to determine the aluminium content of the supports. The calibration of XRF results was done by plotting the Al/Si intensity ratios against the aluminium content as determined by atomic absorption spectrometry (AAS) and verified by instrumental neutron activation analysis (INAA). Correlation factors for the calibration graphs were 0.984 for AlCl3/SiO2 and 0.995 for Al2O3/ SiO2 samples in the aluminium content range 0–2.6 g Al per 100 g of sample.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s002160051328
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