ISSN:
1432-0630
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
x (SiO2)1-x and Fex(SiO2)1-x by conducting atomic force microscopy (C-AFM). The conducting networks (CNs) were mapped via current images using the constant bias mode of C-AFM. By combining the topographic and electric current images simultaneously, the conducting phase can be identified from the insulator matrix. A rapid increase of the conducting phase was observed when x crossed the percolation threshold xc. Therefore the percolation was directly “seen” on a nanometer scale. With this technique, C-AFM is not only a “topographic profiler” but also a “chemical profiler” if the volume fraction of metal phase exceeds the percolation threshold. The factors limiting the lateral resolution will also be discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003390051320
