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X-ray holographic interferometry in the determination of planar multilayer structures. Theory and experimental observations (1971)

Lesslauer, W. ; Blasie, J. K.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 27 (1971), S. 456-461

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: A theoretical treatment of X-ray diffraction from composite multilayer systems is given. These systems consist of two or three structures placed beside one another, each containing a number of different bimolecular leaflets as unit cells. Phase information for one of the structures in the composite system can be obtained, if another structure in the system is known precisely, from the interference of X-ray photons diffracted by the known structure with photons diffracted by the unknown structure. The experimental feasibility is demonstrated in an X-ray diffraction experiment.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0567739471001001

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