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Silicon-crystal rocking curves under X-ray acoustic resonance conditions (1981)

Entin, I. R. ; Assur, K. P.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 37 (1981), S. 769-774

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: Silicon-crystal rocking curves are measured with a high angular resolution (0̃.1′′) under conditions of the Borrmann effect resonant suppression by transverse ultrasonic vibrations. It is shown that on the curves deep minima appear whose positions depend on the vibrational frequency, in agreement with the theory.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0567739481001721

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