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A quantum approach to X-ray multiple diffraction (1988)

Luh, S. W. ; Chang, S. L.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 44 (1988), S. 662-667

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: Quantum theory is applied to X-ray multiple diffraction. Expressions for three-, four-, five- and general N-beam diffraction intensities are derived using the Green-function technique. The asymmetry effect on the diffraction intensity profiles resulting from the reflection phases is revealed in the derived expressions. A schematic representation of the Green function to simplify the multiple-beam intensity problem is also presented.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0108767388003666

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