Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
4 (1971), S. 479-481
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A simple method to correlate dislocations observed in X-ray topographs with etch pits is described and has been applied to the case of cyclotrimethylene trinitramine crystals grown from solution by slow cooling.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889871007490
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