Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
25 (1992), S. 358-365
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
An empirical relationship has been developed that relates the product of the X-ray mass absorption coefficient μ and the extinction distance ξ from dynamical diffraction theory to the ratio of the integrated reflectivities that are predicted from both the kinematic and the dynamical theories of X-ray diffraction. The 111, 222 and 333 integrated reflectivities from samples of CdTe with significantly different etch-pit densities were then measured and analyzed in light of this relationship. The integrated reflectivity measurements suggest that the crystals are of similar crystalline perfection, while the etch-pit densities imply that one crystal is much more perfect than the other. The apparent similarity of the two samples in the diffraction experiments is interpreted with respect to a linear dependence of the ratio Rdyn/Rkin on the parameter In μξ. This result is consistent with the defect structures of the crystals observed using X-ray topography.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889891014048
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