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  • 1
    Electronic Resource
    Electronic Resource
    Texture and residual-stress analysis using a kappa goniometer (1999)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 32 (1999), S. 393-396 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A kappa goniometer allowing the analysis of large samples (thickness up to 60 mm) has been constructed. It was designed to perform the analysis of crystalline texture and residual stress by X-ray diffraction with both χ- (or Ψ-) and Ω-type assembly configurations. Tilt-angle values up to 80° and 2θ values up to 165° can be reached. Validation has been achieved by checking the setting precision and the assembly reliability for the two types of configuration for which the system has been designed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889898015064
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