Electronic Resource
Amsterdam
:
Elsevier
Optics and Laser Technology
21 (1989), S. 117-122
ISSN:
0030-3992
Keywords:
Fourier analysis
;
irradiance moments
;
phase-shifting interferometry
;
surface classification
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0030-3992(89)90031-5
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