Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
81 (2002), S. 1291-1293
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Transmission electron microscopy (TEM) of a perovskite Ba0.5Sr0.5TiO3 thin film, grown on a (001) LaAlO3 substrate by pulsed-laser ablation, reveals that the film of single-crystal quality has an unusually distorted lattice with lattice parameters a and b (parallel to the interface) larger than c (perpendicular to the interface) by 1.4%. There is evidence that the as-examined Ba0.5Sr0.5TiO3 film is a variant of its high-temperature cubic phase due to its anisotropic thermal contraction during cooling. A large lattice mismatch value of 5.7% (to be compared to the normal value of 4.13%) is observed from selected area electron diffraction patterns and high-resolution TEM images of cross-sectional specimens, which suggests that the growing high-temperature film under the film growth condition may have a larger lattice constant and a different thermal expansion behavior with respect to the bulk material. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1500413
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