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Simultaneous topographical and optical characterization of near-field optical aperture probes by way of imaging fluorescent nanospheres (2002)

Höppener, C. ; Molenda, D. ; Fuchs, H. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 80 (2002), S. 1331-1333

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We introduce a method for a simultaneous topographical and optical characterization of aperture probes for scanning near-field optical microscopy which is based on imaging of small sized fluorescent nanospheres (∼20 nm). The near-field optical fluorescence image of a nanosphere maps the intensity distribution of light at the end face of the probe whereas the simultaneously taken height image contains information about the aperture–sample distance. We used this method to control a mechanical modification of a near-field probe. By squeezing a probe repeatedly against a smooth glass substrate and thereby removing obstructing protrusions the aperture was brought as close as possible to the sample surface which resulted in a strongly improved optical resolution. © 2002 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1454220

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