Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
80 (2002), S. 380-382
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present true color maps of a metal surface imaged by scanning tunneling microscopy (STM). Light emission spectra were acquired at each imaging pixel, and converted into a real color map. A rough gold film was shown to exhibit minimal color changes across the sample, so spectra are dependent on material and not sample geometry, due to a small radius tip. A larger tip was still able to distinguish between Ag and Cu clusters with ∼10 nm resolution, despite the onset of geometric effects. We conclude that color mapping represents an ideal way of identifying metals in STM on the nanometer scale. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1433918
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