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Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg–Fresnel lens (2000)

Li, Youli ; Wong, Gerard C. L. ; Case, Ryan ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 77 (2000), S. 313-315

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Details

ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: We investigated the diffractive focusing properties of (111) GaAs linear Bragg–Fresnel lenses (BFLs) developed for hard x-ray microscopy and microdiffraction of complex materials in confined geometries. We demonstrated that the use of GaAs yields significant processing advantages due to the reduced zone depth. Focal plane diffraction patterns of linear BFLs measured at the advanced photon source using 8–40 keV x rays were compared to a simple model based on Kirchhoff–Fresnel diffraction theory. Good agreement was obtained between experimental data and model calculations using only zones within an effective aperture defined by the transverse coherence of the source. © 2000 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.126961

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