Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
71 (1997), S. 2538-2540
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Temperature effects on charge retention characteristics of integrated SrBi2(Ta,Nb)2O9 thin film capacitors were examined in the temperature range of 27–150°C. The decay in remanent polarization at 27°C was linear in logarithmic time from 10−3 to 105 s with a decay rate of 0.24 μC/cm2 per decade. The elevation of storage temperature resulted in an instantaneous decrease in remanent polarization, while the decay rate at elevated temperatures after the instantaneous decrease was as small as that at 27°C. The instantaneous decrease in remanent polarization caused by elevating the temperature was explained by the temperature dependence of spontaneous polarization in the vicinity of the second order transition temperature. The development of asymmetry in the hysteresis loop during high temperature storing indicates that the logarithmic time dependence of the decay in remanent polarization is due to redistribution of space charges rather than polarization reversal. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.120110
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