ZIB

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

Simplified evaluation method for light-biased effective lifetime measurements (1997)

Schuurmans, F. M. ; Schönecker, A. ; Burgers, A. R. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 71 (1997), S. 1795-1797

add to mindlist on the mindlist

Details

ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: In this letter, we present a simplified evaluation method for light-biased photoconductance decay measurements. The measured effective lifetime is shown to be a differential quantity τeff,d, which may differ significantly from the actual effective lifetime τeff. However, the actual effective lifetime can be approximated by integrating τeff,d directly over the incident power density of the bias light. The quality of the approximation depends mainly on the surface recombination velocity and the wavelength of the used bias light. However, the inaccuracy remains well below 10% for most practical cases. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.119401

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit