Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
70 (1997), S. 22-24
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A simple technique is described for optically imaging the lateral distribution of normal forces exerted onto a flat surface. It is based on the detuning of a silicone rubber planar waveguide by the forces to be investigated. The method is demonstrated by imaging the contact line force of a sessile water droplet on the surface, with a force resolution better than μN. It is shown that the lateral resolution may be much better than the decay length of the waveguide modes used. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.119292
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