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Unambiguous photoreflectance determination of electric fields using phase suppression (1996)

Tyan, S. L. ; Wang, Y. C. ; Hwang, J. S. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 68 (1996), S. 3452-3454

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Photoreflectance measurements have been performed on a δ-doped GaAs homojunction. Two Franz–Keldysh oscillation features originating from two different regions (a buffer layer and a top layer) of the structure superimpose with each other in the photoreflectance spectrum. By properly selecting the reference phase, one of the features can be suppressed, thus enabling us to determine the electric fields from the two regions unambiguously. The electric field in the top layer is 3.5±0.2×105 V/cm, which is in good agreement with theoretical calculation. The electric field in the buffer layer is 1.2±0.1×104 V/cm. © 1996 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.115790

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