Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
68 (1996), S. 2985-2986
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The temperature dependence of reflectance and transmittance of a thin (2 μm) CdS film prepared by laser ablation was investigated. The measurements were performed with the 514.5 nm line of an argon laser in the range 180–350 K. It occurred that due to locally enhanced absorption at the film/substrate interface, the transmitted light was considerably weaker than would be theoretically expected for a homogeneous layer. The reflectance, however, followed the theory based on Urbach's rule. The interfacial enhancement of the absorption was confirmed by luminescence investigations. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.116671
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