Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
66 (1995), S. 1581-1583
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A procedure to improve the sensitivity of the two-color Z-scan technique is presented. The sensitivity of the technique as a function of the pump and the probe beam confocal parameters and their relative transverse dimensions is evaluated. The results show that, in the case of small nonlinear phase shift, the sensitivity of the measurements at the probe beam center may be a factor of 4 greater by the appropriate choice of the beams parameters. Results for arbitrary phase shift values and for detection at or out of the probe beam center are also reported. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.113858
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