Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
61 (1992), S. 1128-1130
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Step-edge Josephson junctions are engineered grain boundary junctions fabricated using standard lithographic and film deposition techniques. We report a systematic study of 180 YBa2Cu3O7 step-edge junctions and identify a fabrication technique which results in a 90% yield of working junctions with critical current spreads from 30% to 50% (1σ/Ic-ave)over the entire substrate. Technically useful critical current values at 65 K can be obtained by adjusting YBa2Cu3O7 film thickness. IcRn values, approximately independent of film thickness, are ∼1 mV at 4.2 K and ∼0.1 mV at 65 K. Most junctions exhibit ideal electrical behavior in accordance with the RSJ model.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.107690
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