ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have fabricated YBa2Cu3O7−x thin films using in situ layer-by-layer sputter deposition from metal targets. Yttrium, barium, and copper metals were deposited in the atomic monolayer sequence to construct the perovskite structure in the [001] direction. X-ray diffraction indicates that these films are c-axis oriented with the [001] direction normal to the film surface. Smooth films with zero-resistance transition temperature Tc0=80 K and critical current density Jc(4.2 K)∼2×107 A/cm2, measured in zero magnetic field, have been grown on LaAlO3(100) substrates. Under the conditions studied, all films have a suppressed Tc and an expanded c-axis lattice constant, with the degree of Tc suppression inversely proportional to the lattice constant. Tc and surface morphology were shown to be sensitive to the fractional monolayer coverage φ during each layer's deposition. The results suggest that films grow in the layer-by-layer mode as opposed to island growth.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.108050
