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Identification of epitaxial Y2O3 inclusions in sputtered YBa2Cu3O7 films: Impact on film growth (1992)

Catana, A. ; Broom, R. F. ; Bednorz, J. G. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 60 (1992), S. 1016-1018

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Y2O3 inclusions with typical sizes between 100 and 300 nm3, densely distributed (1016 cm−3) in sputtered YBa2Cu3O7 (YBCO) films on SrTiO3 substrates, have been identified by high-resolution electron microscopy. The precipitates exhibit either cuboid or needlelike shapes and grow epitaxially within and on top of YBCO. The dominant orientation relationship corresponds to a situation where the two-dimensional lattices are nearly coincident in the interfacial (001) plane. These precipitates may contribute to the generation of screw and edge dislocations. In addition, they provide a large number of potential pinning sites for magnetic flux lines, which may contribute to the observed high critical current densities.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.106507

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