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Efficient pulsed laser removal of 0.2 μm sized particles from a solid surface (1991)

Zapka, W. ; Ziemlich, W. ; Tam, A. C.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 58 (1991), S. 2217-2219

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Laser cleaning with pulsed ultraviolet and infrared lasers is successfully employed to remove particulate contamination from silicon wafer surfaces and from delicate lithography membrane masks. Particulate material investigated include latex, alumina, silicon, and gold. Gold particles as small as 0.2 μm can be effectively removed. This new and highly efficient laser cleaning is achieved by choosing a pulsed laser with short pulse duration (without causing substrate damage), and a wavelength that is strongly absorbed by the surface; the removal efficiency is further enhanced by depositing a liquid film of thickness on the order of micron on the surface just before the pulsed laser irradiation.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.104931

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