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Flux creep in Bi2Sr2CaCu2O8 epitaxial films (1990)

Zeldov, E. ; Amer, N. M. ; Koren, G. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 56 (1990), S. 1700-1702

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Details

ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We incorporate the experimentally deduced flux line potential well structure into the flux creep model. Application of this approach to the resistive transition in Bi2Sr2CaCu2O8 epitaxial films explains the power law voltage-current characteristics and the nonlinear current dependence of the activation energy. The results cannot be accounted for by a transition into a superconducting vortex-glass phase.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.103220

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