Digitale Medien
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
55 (1989), S. 354-356
ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
An important component of fracto-emission is the emission of electrons (EE) accompanying the fracture of materials. In this letter we present measurements of EE accompanying the fracture of MgF2 single crystals loaded in three-point bend. In particular, we examine the effect of changing the crystal orientation relative to the loading direction on emission intensity. We find that fracture surfaces with different crystal orientations yield significantly different EE. We propose that this is due to differences in the density of defects produced by such a fracture.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.102419
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