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Exponential temperature dependence of the critical transport current in Y-Ba-Cu-O thin films (1989)

Yom, S. S. ; Hahn, T. S. ; Kim, Y. H. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 54 (1989), S. 2370-2372

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We have measured the critical currents in rf-sputtered YBa2Cu3O7−x thin films deposited on polycrystalline yttria-stabilized zirconia substrates as a function of temperature down to 10 K. The dependence of the granular films at low temperature indicated exponential behavior which is similar to the superconductor-normal metal-superconductor (S-N-S) type tunneling junctions. For the films with a grain size of approximately 1 μm, we observed two exponential decay constants, which suggest that Josephson junctions limiting the transport critical current are possible both at the grain boundaries and at twin boundaries.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.101531

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