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Secondary emission of dielectrics used in plasma display panels (2000)

Auday, G. ; Guillot, Ph. ; Galy, J.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 88 (2000), S. 4871-4874

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: This experimental study concerns the secondary emission coefficient γ for two dielectrics (MgO and enamel) used in plasma display panels. Different pure rare gases were considered at pressures varying from 5 to 50 Torr. Here, we present the variations of coefficient γ as a function of the reduced field E/p. They were obtained by introducing the breakdown voltages measured experimentally on a sample of plasma panel, into the self-sustained equation. Concerning a 0.5 μm thick MgO layer, results are shown for five gases (helium, neon, argon, krypton, and xenon) whereas for a 25 μm thick enamel layer, they are presented for neon and xenon. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1290461

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