ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have used an oriented single crystal of Nd2Fe14B1 as a test sample to explore contrast and resolution as a function of magnetic force microscopy tip coating, tip scan height, and sample history. We find that resolution is independent of tip type; that contrast is greater at low scan heights and for higher moment tips; and that the fine length scale structure of order 25 nm can be resolved. We further show how the surface structure is a function of state (demagnetized or remanent), demonstrating the ability of well-characterized studies to give high-resolution information on carefully prepared samples. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.367536