Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
80 (1996), S. 5617-5624
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Quantitative x-ray-diffraction measurements were performed on a nanocrystalline Cu sample made by severe plastic deformation. The shape of Bragg reflections was found to be represented primarily by a Lorentzian function. A difference of as much as 6%±3% was revealed between the integrated intensities from the nanocrystalline and a reference coarse-grained Cu samples. The broadening of Bragg reflections from the nanocrystalline Cu sample was mainly induced by small crystallite sizes and microstrains inside the grains and/or the deformed layers near the grain boundaries. It was found that the grain sizes of nanocrystalline Cu in different crystallographic orientations are essentially the same, while the microstrains exhibit a significant anisotropy. The Debye–Waller parameter B of the nanocrystalline Cu sample was 0.97±0.06 A(ring)2, which suggests that the atomic displacement from their ideal lattice positions equals on average 0.111±0.004 A(ring) or 4.3% of the nearest-neighbor spacing. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.363612
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