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Submicrometer x-ray beam production by a thin film waveguide (1996)

Lagomarsino, S. ; Jark, W. ; Di Fonzo, S. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 79 (1996), S. 4471-4473

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: A hard x-ray waveguide capable of reducing a 13 keV monochromatic beam in one direction from 30 to only 0.1 μm has been characterized with synchrotron radiation. The guiding structure consisted of a carbon layer sandwiched between two Ni layers sputter-deposited onto float glass. A beam exiting at the end of the guide in guiding direction was observed when a resonance effect due to the formation of x-ray standing waves in the total reflection region takes place. The measured beam divergence (1.3 mrad) agrees with expectations. The total efficiency (exiting photon flux/incident photon flux) can ideally exceed 10−2 but is only 10−4 for this first prototype. © 1996 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.361761

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