ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
To help clarify the sources of the 67% periodic oscillations in the in-plane saturation resistivity, ρS (ρS varied from 2.5 to 5 μΩ cm at 4.2 K) of molecular beam epitaxy-grown epitaxial Ni/Co multilayers of total thickness, tT≈100 nm recently reported by Gallego et al. [Phys. Rev. Lett. 74, 4515 (1995)] we have measured the in-plane resistivities at 4–5 and 295 K of Ag/Cu, Ag/Au, and Ni/Co multilayers with tT≈100 nm, dc sputtered nonepitaxially onto (001) Si. In no case do we see reproducible periodic oscillations, and any variations are always similar at 4–5 and 295 K. Our results show that oscillations of the size seen by Gallego are not simply a consequence of an average multilayer resistivity as low as 3.5 μΩ cm. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.362690