ZIB

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

CdTe nanostructures prepared by thermal annealing (1995)

Ramírez-Bon, R. ; Espinoza-Beltrán, F. J. ; Arizpe-Chávez, H. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 77 (1995), S. 5461-5463

add to mindlist on the mindlist

Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Homogeneous thin films of a-CdTe:O were thermal annealed in an Ar flux. The as-grown samples have an amorphous structure. The annealed films crystallize to a mixture of both CdTe and CdTeO3. For low annealing temperatures (less than 100 °C) it is possible to get CdTe crystallites with sizes smaller than 14 nm. In this work we report measurements of x-ray diffraction and optical absorption spectra of these films. The x-ray diffraction patterns of the films were used to study the CdTe crystallization process as a function of the annealing temperature. The CdTe crystallite size of the films was determined from the diffraction patterns using the Debye–Scherrer formula. It was observed that the CdTe crystallite size increases with annealing temperature. The optical absorption spectra of the films with the smallest CdTe crystallite size show how the absorption band edge of CdTe is shifted by the effects of the crystallite size. © 1995 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.359244

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit