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Atomic structure of Si/TbSi2/(111)Si double-heterostructure interfaces (1994)

Luo, C. H. ; Chen, F. R. ; Chen, L. J.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 76 (1994), S. 5744-5747

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: High-resolution transmission electron microscopy (HRTEM) has been applied to study the atomic structure of the Si/TbSi2/(111)Si double-heterostructure interfaces. The unrelaxed geometrical models of Si/TbSi2/(111)Si interfaces can be systematically deduced from the dichromatic constrained-coincidence-site-lattice patterns. The atomic structures were determined by comparing HRTEM images with computer-simulated images. The relationships of interface bonding and structures of epitaxial Si/TbSi2 and epitaxial TbSi2/Si interfaces are discussed.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.358411

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