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Raman analysis of anodic films on mercury cadmium telluride (1990)

Hill, I. R. ; Chang, W. H. ; Lau, W. M

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 68 (1990), S. 5621-5624

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Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Raman spectroscopy has been used to characterize anodic films grown on n-Hg0.8Cd0.2Te from alkaline media. The spectral results, when compared with those from several reference chemicals, provide unambiguous identification of the anodic film as a 1:1 mixture of amorphous cadmium and mercury tellurites. Since the anodic film is transparent to visible light, Raman spectroscopy was also used to probe nondestructively the substrate surface under the film. The results indicate that the substrate surface was depleted in cadmium.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.347191

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