Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
67 (1990), S. 2156-2157
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Lattice parameters and nearest-neighbor distances have been measured for bulk grown Zn1−xFexSe (0≤x≤0.22) using standard x-ray diffraction and extended x-ray absorption fine structure techniques, respectively. The lattice parameters are in agreement with reported values for molecular beam epitaxy grown films, but differ slightly from published results for other bulk-grown samples. The nearest-neighbor distances suggest a slight distortion from the zinc-blende structure.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.345552
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