Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
66 (1989), S. 5528-5531
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have investigated the temperature dependence of the E1 optical feature (energy and broadening parameter) of Hg0.65Cd0.35Te using electroreflectance in the metal-insulator-semiconductor configuration. Measurements were made in the temperature range 77–293 K. The observed variation can be fit by either a linear dependence or the empirical Varshni relation [Y.P. Varshni, Physica (Utrecht) 39, 149 (1967)] within experimental error. The obtained linear temperature coefficient for E1 is compared with previous results. The temperature dependence of the broadening parameter also is discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.343655
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