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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 2866-2873 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Monte Carlo simulations of amorphous hydrogenated silicon thin-film growth are carried out to examine the effects of film growth reactions, etching reactions, and surface diffusion on three-dimensional film structure. Although a simulated film contains 1000 silicon atoms or less, the hydrogen content and density can be extrapolated to bulk values. The predicted bulk values of the hydrogen content, 11–44 at. %, and density, 1.8–2.0 g/cm3, are consistent with experimental results. The surface diffusion of silicon-containing species is found to have the most significant effect on the final film properties. A knowledge of the specific chemical mechanism leading to film growth is not assumed.
    Type of Medium: Electronic Resource
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