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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 3844-3846 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have attempted to prepare Fe-Al-Si-N films by rf magnetron sputtering in an atmosphere of Ar+N2, employing an Fe-Al-Si target, and investigated the influence of nitrogen on the properties of sendust alloys. Some properties, such as Vicker's hardness and electrical resistivity of the films, were improved in the presence of nitrogen. In addition, the Fe-Al-Si-N films interestingly show superior magnetic properties to those of sendust films. For example, effective permeability at 1 MHz of the film, prepared under the selected conditions, reached a maximum of approximately 4000, exceeding 2200 of our standard sendust film. The microstructure of Fe-Al-Si-N and Fe-Al-Si films has been observed using scanning electron microscopy. As a result, we have found a difference in microstructure between the nitrogen-containing films and the regular films.
    Type of Medium: Electronic Resource
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