Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
60 (1986), S. 24-35
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
An improved pulsed Townsend technique for the measurement of electron transport parameters in gases is described. The accuracy and sensitivity of the technique have been investigated by performing, respectively, electron attachment coefficient measurements in pure O2 over a wide range of E/N at selected O2 pressures and by determining the electron attachment and ionization coefficients and electron drift velocity in CH4 over a wide E/N range. Good agreement has been obtained between the present and the previously published electron attachment coefficients in O2 and for the drift velocity measurements in CH4. The data on the electron attachment coefficient in CH4 (measured for the first time) showed that with the present improved pulsed Townsend method, electron attachment coefficients up to 10 times smaller than the ionization coefficients at a given E/N value can be accurately measured. Our measurements of the electron attachment and ionization coefficients in CH4 are in good agreement with a Boltzmann equation analysis of the electron gain and loss processes in CH4 using published electron scattering cross sections for this molecule.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.337690
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