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Electron diamagnetic drift effect on the trapped hot particle-driven resistive interchange mode (1997)

You, K.-I. ; Choi, D.-I. ; Kim, J.-Y.

[S.l.] : American Institute of Physics (AIP)

Physics of Plasmas 4 (1997), S. 496-498

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ISSN: 1089-7674

Source: AIP Digital Archive

Topics: Physics

Notes: The linearized flux-surface-averaged resistive magnetohydrodynamic equations, which include the electron diamagnetic drift and hot particle effects, are derived and studied numerically. The effect of electron diamagnetic drift on the trapped hot particle-driven resistive interchange mode is then investigated. It is shown that the effect can have a strong stabilization effect on the mode, similar to the conventional resistive interchange mode case. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.872117

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