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Energy analysis of negative hydrogen ions using detached electrons : The 8th international conference on ion sources (2000)

Takahashi, M.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 71 (2000), S. 1101-1103

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: An electron of a negative hydrogen ion (H−) can be easily detached by collisions with an external laser beam or residual gas molecules in the beam line, because its electron affinity is small (0.754 eV). The detached electrons provide information about the original negative hydrogen ions and should have the same velocity as the original hydrogen ions. By measuring the energy of the detached electrons, the energy of a negative hydrogen-ion beam can be estimated. A preliminary experimental result of an energy analysis of a H− beam using detached electrons is presented. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1150396

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