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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 1093-1099 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Commonly diagnostic systems are sensitive to a wide range of parameters, only a subset of which are parameters of interest. Optimal analysis and assessment of diagnostic capability must take account of the sensitivity to the remaining nuisance parameters which may not be accurately known. New least squares type methods of inference in the presence of uncertain nuisance parameters have been developed, along with methods for assessing diagnostic capability and identifying critical nuisance parameter uncertainties. These methods are of a general nature and suitable for complex and computationally demanding forward models. They are demonstrated by application to collective Thomson scattering for fast ion diagnosis in fusion plasmas. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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