ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A YAG laser Thomson scattering system has been developed to measure the time evolution of electron temperature (Te) and density (ne) profiles in the JT-60U. Presently this system provides Te and ne periodically every 100 ms (20 ms at the minimum) at 15 spatial channels. A six spectrum channel polychromator, which is a successive interference filter type, was designed to measure a wide Te range (20 eV–20 keV) by using five channels. The sixth channel is used for calibration by Rayleigh scattering. However, we also used the Rayleigh channel to measure Te and ne since the stray light level was very low. As a result, we were able to measure temperatures below 20 eV. The temperature of the silicon avalanche photodiode (APD) is stabilized by a Péltier element so that the gain is kept constant within ±0.5%. The stable performance of the APD enables accurate Te and ne measurement. During plasma operation, the electron temperature is measured over a wide range from the low temperature plasmas in the runaway plasma current tail generated by a killer pellet to the high temperatures of high performance negative shear plasmas. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149392
